Webinar Overview:
This webinar will explore the motivation for using a microcontroller for machine state monitoring, as well as the challenges and benefits.
The process will be illustrated using a practical example of how an MCX N Series MCU from webinar partner NXP can utilize a Fully Connected / CNN neural network model to accomplish this.
The webinar will cover:
- Motivation for monitoring machine state
- Compute options
- AI model preparation
- Converting a model for an MCU with AI Accelerator
- Using TFLite Micro (TFLM) interpreter to run a model
- Creating an application using model
Attendance is free of charge, register now!
Dr Rahul Dubey Doulos Member Technical Staff, will present this training webinar, which will consist of a one-hour session and be interactive with Q&A participation from attendees.
Attendance is free of charge
If you have any queries, please contact webinars@doulos.com
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